Alif Semiconductor /AE512F80F55D5AS_CM55_HE_View /ADC120 /ADC_REG1

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Interpret as ADC_REG1

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 (Val_0x0)ADC1_TEST_EN 0 (Val_0x0)ADC1_DIFFERENTIAL_EN 0 (Val_0x0)ADC1_COMPARATOR_EN 0 (Val_0x0)ADC1_COMPARATOR_BIAS 0 (Val_0x0)ADC1_VCM_RDIV_EN 0 (Val_0x0)ADC2_TEST_EN 0 (Val_0x0)ADC2_DIFFERENTIAL_EN 0 (Val_0x0)ADC2_COMPARATOR_EN 0 (Val_0x0)ADC2_COMPARATOR_BIAS 0 (Val_0x0)ADC2_VCM_RDIV_EN 0 (Val_0x0)ADC3_TEST_EN 0 (Val_0x0)ADC3_DIFFERENTIAL_EN 0 (Val_0x0)ADC3_COMPARATOR_EN 0 (Val_0x0)ADC3_COMPARATOR_BIAS 0 (Val_0x0)ADC3_VCM_RDIV_EN 0AMUX_CONT

ADC1_COMPARATOR_BIAS=Val_0x0, ADC1_VCM_RDIV_EN=Val_0x0, ADC1_TEST_EN=Val_0x0, ADC3_VCM_RDIV_EN=Val_0x0, ADC2_TEST_EN=Val_0x0, ADC2_COMPARATOR_EN=Val_0x0, ADC3_COMPARATOR_EN=Val_0x0, ADC2_COMPARATOR_BIAS=Val_0x0, ADC2_DIFFERENTIAL_EN=Val_0x0, ADC1_COMPARATOR_EN=Val_0x0, ADC2_VCM_RDIV_EN=Val_0x0, ADC3_TEST_EN=Val_0x0, ADC3_COMPARATOR_BIAS=Val_0x0, ADC1_DIFFERENTIAL_EN=Val_0x0, ADC3_DIFFERENTIAL_EN=Val_0x0

Description

ADC Analog Control Register for ADC12 Modules

Fields

ADC1_TEST_EN

Enable ADC120 test signal to go to the test MUX:

0 (Val_0x0): Disabled

1 (Val_0x1): Enabled

ADC1_DIFFERENTIAL_EN

Enable ADC120 differential mode:

0 (Val_0x0): IN0, IN1, IN2, IN3, IN4, and IN5 are single-ended inputs

1 (Val_0x1): IN0/IN1, IN2/IN3, and IN4/IN5 make 3 differential inputs

ADC1_COMPARATOR_EN

Enable ADC120 comparator:

0 (Val_0x0): Comparator is off

1 (Val_0x1): Comparator is enabled

ADC1_COMPARATOR_BIAS

ADC120 comparator biasing:

0 (Val_0x0): 0.5 MS/s

1 (Val_0x1): 1 MS/s

2 (Val_0x2): 2.5 MS/s

3 (Val_0x3): 5 MS/s

ADC1_VCM_RDIV_EN

Enable ADC120 resistive divider:

0 (Val_0x0): The resistive divider is off, common mode is not well defined

1 (Val_0x1): The resistive divider is on, common mode is VDD/2

ADC2_TEST_EN

Enable ADC121 test signal to go to the test MUX:

0 (Val_0x0): Disabled

1 (Val_0x1): Enabled

ADC2_DIFFERENTIAL_EN

Enable ADC121 differential mode:

0 (Val_0x0): IN0, IN1, IN2, IN3, IN4, and IN5 are single-ended inputs

1 (Val_0x1): IN0/IN1, IN2/IN3, and IN4/IN5 make 3 differential inputs

ADC2_COMPARATOR_EN

Enable ADC121 comparator:

0 (Val_0x0): Comparator is off

1 (Val_0x1): Comparator is enabled

ADC2_COMPARATOR_BIAS

ADC121 comparator biasing:

0 (Val_0x0): 0.5 MS/s

1 (Val_0x1): 1 MS/s

2 (Val_0x2): 2.5 MS/s

3 (Val_0x3): 5 MS/s

ADC2_VCM_RDIV_EN

Enable ADC121 resistive divider:

0 (Val_0x0): The resistive divider is off, common mode is not well defined

1 (Val_0x1): The resistive divider is on, common mode is VDD/2

ADC3_TEST_EN

Enable ADC122 test signal to go to the test MUX:

0 (Val_0x0): Disabled

1 (Val_0x1): Enabled

ADC3_DIFFERENTIAL_EN

Enable ADC122 differential mode:

0 (Val_0x0): IN0, IN1, IN2, IN3, IN4, and IN5 are single-ended inputs

1 (Val_0x1): IN0/IN1, IN2/IN3, and IN4/IN5 make 3 differential inputs

ADC3_COMPARATOR_EN

Enable ADC122 comparator:

0 (Val_0x0): Comparator is off

1 (Val_0x1): Comparator is enabled

ADC3_COMPARATOR_BIAS

ADC122 comparator biasing:

0 (Val_0x0): 0.5 MS/s

1 (Val_0x1): 1 MS/s

2 (Val_0x2): 2.5 MS/s

3 (Val_0x3): 5 MS/s

ADC3_VCM_RDIV_EN

Enable ADC122 resistive divider:

0 (Val_0x0): The resistive divider is off, common mode is not well defined

1 (Val_0x1): The resistive divider is on, common mode is VDD/2

AMUX_CONT

Analog test mux control (external to ADC12). Bit 31 is a master enable (set to 1 to enable AMUX). Upper 4 bits determine mux section [30:27]. Lower 3 bits select mux input [26:24]. Default = 0x0

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